The Evolution and Decay of Statically Detected Source Code Vulnerabilities

Published in Eighth IEEE International Working Conference on Source Code Analysis and Manipulation (SCAM 2008), 28-29 September 2008, Beijing, China, 2008

Recommended citation: Massimiliano Di Penta, Luigi Cerulo, Lerina Aversano, "The Evolution and Decay of Statically Detected Source Code Vulnerabilities." Eighth IEEE International Working Conference on Source Code Analysis and Manipulation (SCAM 2008), 28-29 September 2008, Beijing, China, 2008. https://doi.org/10.1109/SCAM.2008.20

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