Relating the Evolution of Design Patterns and Crosscutting Concerns

Published in Seventh IEEE International Workshop on Source Code Analysis and Manipulation (SCAM 2007), September 30 - October 1, 2007, Paris, France, 2007

Recommended citation: Lerina Aversano, Luigi Cerulo, Massimiliano Di Penta, "Relating the Evolution of Design Patterns and Crosscutting Concerns." Seventh IEEE International Workshop on Source Code Analysis and Manipulation (SCAM 2007), September 30 - October 1, 2007, Paris, France, 2007. https://doi.org/10.1109/SCAM.2007.21