Relationship between design patterns defects and crosscutting concern scattering degree: an empirical study

Published in IET Software, 2009

Recommended citation: Lerina Aversano, Luigi Cerulo, Massimiliano Di Penta, "Relationship between design patterns defects and crosscutting concern scattering degree: an empirical study." IET Software, 2009. https://doi.org/10.1049/iet-sen.2008.0105